Reliability, Yield, and Stress Burn-In

Reliability, Yield, and Stress Burn-In

4.11 - 1251 ratings - Source

This book will also help readers to analyze systems that exhibit high failure rate during a long infant mortality period. Reliability, Yield, and Stress Burn-In presents ways to systematically analyze burn-in policy at that component, sub-system, and system levels. Various statistical methods are addressed including parametric, nonparametric, and Bayesian approaches. Many case studies are introduced in combination with the developed theories. Included in the book is an introduction to software reliability.1986, pp 950-967. [3] Agarwala, A.S., aquot;Shortcomings in MIL-STD-1629A guidelines for criticality analysis, aquot; ... [13] ATaamp;T, ATaamp;T Reliability Manual. Edited by Klinger.D.J., Nakada.Y., and Meenedez.M.A., Van Nostrand Rheinhold, New York, anbsp;...


Title:Reliability, Yield, and Stress Burn-In
Author: Way Kuo, Wei-Ting Kary Chien, Taeho Kim
Publisher:Springer Science & Business Media - 1998
ISBN-13:

You must register with us as either a Registered User before you can Download this Book. You'll be greeted by a simple sign-up page.

Once you have finished the sign-up process, you will be redirected to your download Book page.

How it works:
  • 1. Register a free 1 month Trial Account.
  • 2. Download as many books as you like (Personal use)
  • 3. Cancel the membership at any time if not satisfied.


Click button below to register and download Ebook
Privacy Policy | Contact | DMCA